The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes.
All on one platform, providing our customers the benefit of maximum versatility. The cards’ advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test.Ĭoverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices.
#Ultra high performance probe cards pro#
Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today’s and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. ADVANTEST’s Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide.Īrchitecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Capabilities when and where they are neededįloating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. DUT boards can be exchanged, as well as test programs. V93000 SCALABLE BUILDING BLOCKS Compatibility across the whole platformĪll card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. The user benefits are reduced test time, best repeatability and simplified program creation.
#Ultra high performance probe cards full#
Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers’ capital investment.Īdvantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test.
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